Characterization System and Method With Guided Defect Discovery
AssigneeKLA Corporation
InventorsBradley Ries, Tommaso Torelli, Muthukrishnan Sankar, Vineethanand Hariharan
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AssigneeKLA Corporation
InventorsBradley Ries, Tommaso Torelli, Muthukrishnan Sankar, Vineethanand Hariharan
Estimating the term…
A system is disclosed, in accordance with one or more embodiment of the present disclosure. The system may include a controller including one or more processors configured to execute a set of program instructions. The set of program instructions may be configured to cause the processors to: receive images of a sample from a characterization sub-system; identify target clips from patch clips; prepare processed clips based on the target clips; generate encoded images by transforming the processed clips; sort the encoded images into a set of clusters; display sorted images from the set of clusters; receive labels for the displayed sorted images; determine whether the received labels are sufficient to train a deep learning classifier; and upon determining the received labels are sufficient to train the deep learning classifier, train the deep learning classifier via the displayed sorted images and the received labels.
A system comprising:
A system comprising:
A method comprising:
A method comprising:
A system comprising:
A method comprising:
Dependencies are inferred from the claim text.