Simultaneous focal length control and achromatic computational imaging with quartic metasurfaces
AssigneeUniversity of Washington
InventorsShane Colburn, Arka Majumdar
Life of this patent
Estimating the term…
Abstract
Systems and methods for simultaneous focal length control and achromatic computational imaging with quartic metasurfaces are disclosed herein. In one embodiment, an imaging system includes: a first metalens having a plurality of first nanoposts carried by a first substrate; a second metalens having a plurality of second nanoposts carried by a second substrate; and a source of light configured to emit light toward the first metalens and the second metalens. The first metalens is transversely offset with respect to the second metalens.
Claims22
An imaging system, comprising:
- a first metalens comprising a plurality of first nanoposts carried by a first substrate;
- a second metalens comprising a plurality of second nanoposts carried by a second substrate;
- and
- a source of light configured to emit light toward the first metalens and the second metalens,
- wherein the first metalens is transversely offset with respect to the second metalens.
A method for focusing an achromatic beam of light, comprising:
- transversely offsetting a first metalens and a second metalens, wherein the first metalens comprises a plurality of first nanoposts carried by a first substrate, and a second metalens comprises a plurality of second nanoposts carried by a second substrate;
- illuminating the first metalens and the second metalens with a source of light;
- and
- generating a focal area axially away from the first metalens and the second metalens.
Dependencies are inferred from the claim text.