US 2021/0199716 A1Published application

Testing device and testing method

AssigneeKabushiki Kaisha Tokai Rika Denki Seisakusho

InventorSunao NAGAI

Life of this patent

Estimating the term…

Loading patent…

Abstract

When testing a reset circuit, a first register outputs a set signal to an OR circuit of the reset circuit so that a logic circuit is not reset even if an input voltage is low. Further, when testing the reset circuit, the first register turns off a regulator circuit by outputting a set signal from a second register to the regulator circuit and supplying the input voltage to the reset circuit from an external device via a voltage application terminal. Subsequently, the input voltage supplied from the voltage application terminal is varied and an output signal of a comparator output from a signal output circuit through an external terminal is checked to test whether the reset circuit is actuated normally.

Claims10

Dependent claims

A testing device, comprising:

an analog circuit configured to compare an input voltage and a threshold value with a comparator, based on a control signal corresponding to the comparison result, actuate a logic circuit in a first actuation state when the input voltage is less than the threshold value, and actuate the logic circuit in a second actuation state when the input voltage is greater than or equal to the threshold value;
an overriding unit configured to output a set signal to the analog circuit from an element arranged in advance in the logic circuit when testing the analog circuit so that the logic circuit is shifted to the second actuation state even if the input voltage is less than the threshold value;
and
a switch output arranged in the logic circuit and switched to a state for monitoring an output signal of the comparator and outputting the output signal of the comparator to a device outside the logic circuit when testing the analog circuit,
wherein when testing the analog circuit, the testing device varies the input voltage supplied to the comparator and checks the output signal of the comparator from an output of the switch output to determine whether the analog circuit is actuated normally.

2 more elements

A method for testing, comprising:

comparing, by an analog circuit, an input voltage and a threshold value with a comparator, based on a control signal corresponding to the comparison result, actuating a logic circuit in a first actuation state when the input voltage is less than the threshold value, and actuating the logic circuit in a second actuation state when the input voltage becomes greater than or equal to the threshold value,
shifting the logic circuit to the second actuation state even if the input voltage is less than the threshold value by outputting a set signal to the analog circuit from an element arranged in advance in the logic circuit when testing the analog circuit;
outputting an output signal of the comparator via a switch output arranged in the logic circuit to a device outside the logic circuit by switching the switch output to a state for monitoring the output signal of the comparator when testing the analog circuit;
and
testing whether the analog circuit is actuated normally by varying the input voltage supplied to the comparator and checking the output signal of the comparator from an output of the switch output when testing the analog circuit.

2 more elements

Dependencies are inferred from the claim text.