Analysis apparatus, analysis method, and recording medium having recorded thereon analysis program
AssigneeAdvantest Corporation
InventorsYuji SAKAI, Hajime SUGIMURA
Life of this patent
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AssigneeAdvantest Corporation
InventorsYuji SAKAI, Hajime SUGIMURA
Estimating the term…
There is provided an analysis apparatus including: an acquisition unit configured to acquire a plurality of measured values obtained by measuring a device under measurement; a machine learning unit configured to use the plurality of measured values to learn, by machine learning, a model of a position-dependent component that depends on a measured position in the device under measurement; and an analysis unit configured to separate, from the plurality of measured values, the position-dependent component which is calculated by using the model learned by the machine learning unit. Further, there is provided an analysis method. Further, there is provided a recording medium having recorded thereon an analysis program.
An analysis apparatus comprising:
An analysis method in which an analysis apparatus performs an analysis, the analysis method comprising:
A recording medium having recorded thereon an analysis program that is executed by a computer and causes the computer to function as:
Dependencies are inferred from the claim text.