Analysis apparatus, analysis method, and recording medium having recorded thereon analysis program
AssigneeAdvantest Corporation
InventorsYuji SAKAI, Hajime SUGIMURA
Life of this patent
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AssigneeAdvantest Corporation
InventorsYuji SAKAI, Hajime SUGIMURA
Estimating the term…
In order to analyze a plurality of measured values obtained by measuring a device under measurement and to effectively use the analyzed information, there is provided a recording medium having recorded thereon an analysis apparatus, the analysis apparatus including: an acquisition unit configured to acquire the plurality of measured values obtained by measuring the device under measurement via a jig; an analysis unit configured to analyze the plurality of measured values to calculate variation data which indicates a variation of a measured value in accordance with the number of times of contacts that the jig comes into contact with the device under measurement; and a management unit configured to manage a state of the jig based on the variation data.
An analysis apparatus comprising:
An analysis method in which an analysis apparatus performs an analysis, the analysis method comprising:
A recording medium having recorded thereon an analysis program that is executed by a computer and causes the computer to function as:
Dependencies are inferred from the claim text.