Silicided source/drain terminals for field-effect transistors
AssigneeGlobalFoundries Dresden Module One Limited Liability Company & Co. KG
InventorsMaximilian Ludwig Drescher, Violetta Sessi
Life of this patent
Estimating the term…
Loading patent…
AssigneeGlobalFoundries Dresden Module One Limited Liability Company & Co. KG
InventorsMaximilian Ludwig Drescher, Violetta Sessi
Estimating the term…
Structures including field-effect transistors and methods of forming a structure including field-effect transistors. A first field-effect transistor includes a first source/drain terminal and a second source/drain terminal, and a second field-effect transistor includes a third source/drain terminal and a fourth source/drain terminal. The first source/drain terminal and the second source/drain terminal each include a fully-silicided section located at and above a top surface of a semiconductor layer. The third source/drain terminal and the fourth source/drain terminal each include a partially-silicided section located over the top surface of the semiconductor layer.
A structure comprising:
(canceled)
A structure comprising:
(canceled)
The method of claim 15 wherein the third source/drain terminal includes a first section of semiconductor material separating the third section of the silicide layer from the top surface of the semiconductor layer, and the fourth source/drain terminal includes a second section of semiconductor material separating the fourth section of the silicide layer from the top surface of the semiconductor layer.
A method comprising:
Dependencies are inferred from the claim text.