Method and Apparatus for Automated Test Plan Generation to Measure a Measurement Object

An apparatus for generating a test plan for testing a measurement object, the apparatus comprising:

• an interface;
• and
• an evaluation device,
• wherein:
• the interface is configured to read a data record representing the measurement object,
• the evaluation device is configured to set a reference structure based on data,
• the evaluation device is configured to assign at least one reference structure-specific test feature to the reference structure,
• the evaluation device is configured to test, based on data for the data record representing the measurement object, whether structures similar to or the same as the reference structure are present,
• the evaluation device is configured to assign the reference structure-specific test feature to each similar or same structure as a structure-specific test feature, and
• the evaluation device is configured to generate the test plan including the structure-specific test features.