Block quality classification at testing for non-volatile memory, and multiple bad block flags for product diversity

A non-volatile memory system, comprising:

• a memory die, comprising:
• a plurality of blocks each comprising a plurality of non-volatile memory cells;
• and
• a non-volatile system memory section storing, for each of the blocks, a multi-bit flag value indicating one of a plurality of recoverability categories of a corresponding block, the recoverability categories including a good block category, an unusable block category, and one or more intermediate recoverability level categories;
• and
• a memory controller connected to the memory die and configured to:
• perform a power on sequence for the memory die, the power on sequence including reading out the multi-bit flag values from the memory die and storing the multi-bit flag values in operating memory for the memory controller;
• and
• select blocks of the memory die based upon an ordering of the blocks weighted by the recoverability category of each of the blocks in the ordering.

A non-volatile memory die, comprising:

• a plurality of blocks each comprising a plurality of non-volatile memory cells;
• a non-volatile system memory storing, for each of the blocks, a multi-bit flag value indicating one of a plurality of recoverability categories for a corresponding block, and the recoverability categories include a good block category, an unusable block category, and a one or more recoverability level categories;
• and
• one or more on-die control circuits connected to the blocks and to the non-volatile system memory, the one or more control circuits are configured to write data to and read data from the blocks, and to read the plurality of multi-bit flag values and provide the plurality of multi-bit flag values externally to the memory die during a power on sequence.