Leakage compensation circuit for a capacitive or resistive measurement device

A leakage compensation circuit for a measurement device which comprises a measurement circuit with a leaking device that is connected to a measurement path and causes a leakage current, the leakage compensation circuit comprising:

• a replica device of the leaking device, wherein the replica device is connected to a replica path, and wherein the replica device is configured to cause a replica leakage current that is essentially equal to the leakage current of the leaking device;
• a voltage regulator which is connected to the measurement path and to the replica path, wherein the voltage regulator is configured to regulate the voltage in the replica path based on the voltage of the measurement path;
• and
• a current mirror which is connected to the measurement path and to the replica path, wherein the current mirror is configured to mirror the replica leakage current of the replica device into the measurement path.

A measurement device, comprising:

• a measurement circuit that comprises:
• a measurement path, and
• a leaking device that is connected to the measurement path and causes a leakage current;
• and
• a leakage compensation circuit that is connected to the measurement path, the leakage compensation circuit comprising:
• a replica device of the leaking device, wherein the replica device is connected to a replica path, and wherein the replica device is configured to cause a replica leakage current that is essentially equal to the leakage current of the leaking device;
• a voltage regulator which is connected to the measurement path and to the replica path, wherein the voltage regulator is configured to regulate the voltage in the replica path based on the voltage of the measurement path;
• and
• a current mirror which is connected to the measurement path and to the replica path, wherein the current mirror is configured to mirror the replica leakage current of the replica device into the measurement path.

A method for compensating a leakage in a measurement device which comprises a measurement circuit with a leaking device that is connected to a measurement path and causes a leakage current, the method comprising:

• providing a replica device of the leaking device, wherein the replica device is connected to a replica path;
• causing, by the replica device, a replica leakage current that is essentially equal to the leakage current of the leaking device;
• regulating, by a voltage regulator which is connected to the measurement path and to the replica path, the voltage in the replica path based on the voltage of the measurement path;
• and
• mirroring, by a current mirror which is connected to the measurement path and to the replica path, the leakage current of the replica device into the measurement path.