Methods, systems and computer program products for monitoring field device states in a process control system

A system for monitoring field device parameter state changes within a process control system, the system comprising:

• a plurality of field devices;
• and
• a monitoring server configured:
• for each field device within a selected sub-set of the plurality of field devices, to:
• retrieve a first set of field device parameter state data associated with the field device, wherein the first set of field device parameter state data represents either (i) reference parameter states associated with the field device, or (ii) a stored set of prior parameter states associated with the field device, and which prior parameter states are distinct from a current set of parameter states associated with the field device;
• obtain a second set of field device parameter state data associated with the field device, wherein the second set of field device parameter state data represents a current set of parameter states associated with the field device;
• compare the first set of field device parameter state data and the second set of field device parameter state data respectively corresponding to the field device;
• detect deviations between the compared first set of field device parameter state data and second set of field device parameter state data;
• and
• display on a display device, for each field device within the selected sub-set of the plurality of field devices, data representing the detected deviations between the first set of field device parameter state data and the second set of field device parameter state data.

A computer program product for monitoring field device parameter state changes within a process control system comprising a plurality of field devices, the computer program product comprising a non-transitory computer usable medium having a computer readable program code embodied therein, the computer readable program code comprising instructions for implementing within a processor based computing system, the steps of:

• for each field device within a selected sub-set of the plurality of field devices,
• retrieving a first set of field device parameter state data associated with the field device, wherein the first set of field device parameter state data represents either (i) reference parameter states associated with the field device, or (ii) a stored set of prior parameter states associated with the field device, and which prior parameter states are distinct from a current set of parameter states associated with the field device;
• obtaining a second set of field device parameter state data associated with the field device, wherein the second set of field device parameter state data represents a current set of parameter states associated with the field device;
• comparing the first set of field device parameter state data and the second set of field device parameter state data respectively corresponding to the field device;
• and
• detecting deviations between the compared first set of field device parameter state data and second set of field device parameter state data;
• and
• displaying on a display device, for each field device within the selected sub-set of the plurality of field devices, data representing the detected deviations between the first set of field device parameter state data and the second set of field device parameter state data.