Measurement setup, reference reflector as well as method for measuring attenuation

A measurement setup for measuring attenuation through an irregular surface of a device under test, comprising:

• a positioning system;
• a reference reflector;
• a three dimensional imaging system having a field of view, the three dimensional imaging system being configured to use electromagnetic signals in the frequency range of a radar system;
• the measurement setup having a reference state and a measurement state;
• the positioning system, in the reference state, being configured to position the reference reflector without the device under test in the field of view of the imaging system;
• the positioning system, in the measurement state, being further configured to position the reference reflector and the device under test in the field of view of the imaging system, the device under test being located between the imaging system and the reference reflector;
• the imaging system, in the reference state, being configured to take a reference image of the reference reflector;
• the imaging system, in the measurement state, being configured to take a measurement image of the reference reflector while the device under test is arranged between the imaging system and the reference reflector;
• the imaging system being further configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test.