US 2021/0172979 A1 · TEST BOARD AND TEST APPARATUS FOR TESTING ELECTRONIC APPARATUSES HAVING SEMICONDUCTOR DEVICES

Abstract

A test board and a test apparatus having the same are disclosed. The test board includes a base plate including a connector and a plurality of mounting areas in a matrix shape having a mounting row in a first direction and a mounting column in a second direction, a plurality of test units arranged on the mounting areas of the base plate and a test object is mounted in each of the mounting areas, and a fluid supplier disposed on the base plate and supplying a test fluid to each of the test units having a test temperature and a supplementary fluid to the test object to reduce a temperature difference between an actual temperature of the test object and the test temperature such that the actual temperature of the test objects is substantially below the test temperature.

Claims20

Dependent claims

A test board for mounting a plurality of test objects, comprising:

a base plate including at least a connector and a plurality of mounting areas in a matrix shape having at least a mounting row in a first direction and at least a mounting column in a second direction substantially perpendicular to the first direction;
a plurality of test units arranged on the mounting areas of the base plate, respectively, and a test object is mounted in each of the mounting areas for an operational test;
and
a fluid supplier disposed on the base plate and supplying a test fluid to each of the test units for the operational test having a test temperature and a supplementary fluid to the test object to reduce a temperature difference between an actual temperature of the test object and the test temperature such that the actual temperature of the test objects is substantially below the test temperature.

1 more element

A test apparatus for conducting an operational test on a plurality of test objects, comprising:

a test head including electronic instruments that generates a test signal for testing the test objects and detects and analyzes operational signals generated from the test objects in response to the test signal;
a plurality of test boards on each of which the test objects are mounted in a matrix shape such that each of the test boards includes a connector and supplies a supplementary fluid for reducing a temperature difference of the test objects as well as a test fluid for conducting the operational test;
and
a test chamber including a connector plate that is connected to the test head and a plurality of the connectors of the test boards and receiving a plurality of the test boards such that the operational test is conducted on each of the test objects under a test temperature.

1 more element

Dependencies are inferred from the claim text.

Test board and test apparatus for testing electronic apparatuses having semiconductor devices

Life of this patent

Test board and test apparatus for testing electronic apparatuses having semiconductor devices

Life of this patent

Abstract

Claims20