Semiconductor device
AssigneeKioxia Corporation
InventorsTakayuki KAKEGAWA, Shinya Naito
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AssigneeKioxia Corporation
InventorsTakayuki KAKEGAWA, Shinya Naito
Estimating the term…
According to an embodiment, a semiconductor device has a first and second region, and a semiconductor channel. The first region includes a peak of a concentration profile of a first impurity of a first conductivity type. The first region extends from a surface of the substrate, through a depth range including the concentration profile of a second impurity of a second conductivity type, to a depth of an intersection of the concentration profile of the first impurity and the concentration profile of the second impurity. The second region includes a concentration profile of a third impurity, and the second region overlaps at least part of the first region. The concentration profile of the third impurity is higher in concentration than the concentration profile of the first impurity throughout a depth direction of the second region. One end of the semiconductor channel reaches the first and second region.
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.