Best solution calculation method and dominant solution calculation method for calculation parameter in powder diffraction pattern, and program thereof
AssigneePhysonit Inc.
InventorMasami TSUBOTA
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AssigneePhysonit Inc.
InventorMasami TSUBOTA
Estimating the term…
The present invention provides a method to calculate refinement parameters from an observed diffraction pattern for powder samples accurately. A method to calculate a best solution of the crystal structural parameters from a diffraction pattern, comprising: a third calculating step of the converged values 600 to calculate at least three converged values; a third judging step of the best converged values 700 to calculate at least three criteria from the peak-shift parameters in the converged values and to judge whether the converged values are a true solution of not by using the criteria; and a first calculating step of a global solution 800 to calculate a global solution of which is the true value by using the criteria.
A calculation method to judge a best solution of refinement parameters for a powder diffraction pattern, comprising:
A calculation method to judge a better solution of refinement parameters for a powder diffraction pattern, comprising:
A calculation method to judge a best solution of refinement parameters for a powder diffraction pattern, comprising:
A calculation program to judge a best solution of refinement parameters for a powder diffraction pattern, comprising:
A calculation program to judge a better solution of refinement parameters for a powder diffraction pattern, comprising:
A calculation program to judge a best solution of refinement parameters for a powder diffraction pattern, comprising:
A calculation method to judge the best solution of refinement parameters for a powder diffraction pattern, comprising a criterion relating to information along the x-axis of the data, which is calculated directly from the peak-shift parameters and the lattice parameters, wherein “the x-axis of the data” indicates a physical quantity which corresponds to the space lattice of the unit cell such as a diffraction angle or time-of-flight.
A calculation program to judge the best solution of refinement parameters for a powder diffraction pattern, comprising a criterion relating to information along the x-axis of the data, which is calculated directly from the peak-shift parameters and the lattice parameters.
Dependencies are inferred from the claim text.