Mass flow verificaton based on rate of pressure decay
AssigneeApplied Materials, Inc.
InventorsZhiyuan Ye, Justin Hough, Marcel E. Josephson
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AssigneeApplied Materials, Inc.
InventorsZhiyuan Ye, Justin Hough, Marcel E. Josephson
Estimating the term…
An electronic device manufacturing system includes: a gas supply; a mass flow controller (MFC) coupled to the gas supply; an inlet coupled to the MFC; an outlet; a control volume serially coupled to the inlet to receive a gas flow; and a flow restrictor serially coupled to the control volume and the outlet. A controller is adapted to allow the gas supply to flow gas through the control volume and the flow restrictor to achieve a stable pressure in the control volume, terminate the gas flow from the gas supply, and measure a rate of pressure decay in the control volume over time. A process chamber is coupled to a flow path, which is coupled to the mass flow controller, the process chamber to receive one or more process chemistries via the mass flow controller.
An electronic device manufacturing system, comprising:
A method of verifying a mass flow controller, the method comprising:
A system comprising:
Dependencies are inferred from the claim text.