Charged particle beam apparatus
AssigneeKioxia Corporation
InventorsMitsuo KOIKE, See KEI LEE
Life of this patent
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AssigneeKioxia Corporation
InventorsMitsuo KOIKE, See KEI LEE
Estimating the term…
A charged particle beam apparatus has a chamber configured to accommodate a sample with. An inside of the chamber is decompressed. A tube having an opening is disposed in the chamber, and introduces a mixed gas having a plurality of types of gases, in a direction towards the sample. A first beam generator emits a charged particle beam toward at least one of a region between an opening of the tube and the sample, or a region of the sample against which the mixed gas collides. A mixed gas generator provides the mixed gas to the tube. The opening of the tube has an elongated shape in a cross section in a direction substantially perpendicular to a flow direction of the mixed gas.
A charged particle beam apparatus comprising:
A method using a charged particle beam apparatus which comprises
Dependencies are inferred from the claim text.