Scrub management in storage class memory
AssigneeInternational Business Machines Corporation
InventorsRobert Edward Galbraith, Damir Anthony Jamsek, Andrew Kenneth Martin, Daniel Frank Moertl, Charles Camp
Life of this patent
Estimating the term…
Loading patent…
AssigneeInternational Business Machines Corporation
InventorsRobert Edward Galbraith, Damir Anthony Jamsek, Andrew Kenneth Martin, Daniel Frank Moertl, Charles Camp
Estimating the term…
A method and system for collecting diagnostic data from a storage class memory chip is disclosed. The method includes performing a scrub process on at least a portion of the storage class memory by: removing the portion of the storage class memory from use, wherein the portion comprises a plurality of memory locations, executing a first write operation to write a first pattern on each of the plurality of memory locations, executing a first read operation to obtain a first set of data written on each of the plurality of memory locations, analyzing the first set of data written on each of the plurality of memory locations to determine the number of stuck-at faults in the portion, and updating one or more counters in an error rate table (ERT) to indicate the number of stuck-at faults.
A method for collecting diagnostic data from a storage class memory chip, the method comprising:
A computing system for collecting diagnostic data from a storage class memory chip, the system comprising:
Dependencies are inferred from the claim text.