Memory system and method of operating the same
AssigneeSamsung Electronics Co., Ltd.
InventorsJaeduk YU, Bongsoon LIM, Yonghyuk CHOI
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AssigneeSamsung Electronics Co., Ltd.
InventorsJaeduk YU, Bongsoon LIM, Yonghyuk CHOI
Estimating the term…
A memory device, a memory system, and/or a method of operating a memory system includes measuring, using processing circuitry, an erase program interval (EPI) of a memory group included in a non-volatile memory (NVM), the EPI being a time period from an erase time point to a program time point of the memory group, determining, using the processing circuitry, a plurality of program modes based on a number of data bits stored in each memory cell of the memory group, selecting, using the processing circuitry, a program mode for the memory group from the plurality of program modes, based on the measured EPI of the memory group, and performing, using the processing circuitry, a program operation on the memory group corresponding to the selected program mode.
A method of operating a memory system, the memory system including a non-volatile memory, the non-volatile memory including a memory cell region including a memory group and a first metal pad, and a peripheral circuit region including a second metal pad and vertically connected to the memory cell region by the first metal pad and the second metal pad, the method comprising:
A method of operating a memory system, the memory system including a non-volatile memory, the non-volatile memory including a memory cell region including a memory block and a first metal pad, and a peripheral circuit region including a second metal pad and vertically connected to the memory cell region by the first metal pad and the second metal pad, the method comprising:
A memory system comprising:
Dependencies are inferred from the claim text.