SEB Resistance Evaluation Method and SEB Resistance Evaluation Device
AssigneeMitsubishi Electric Corporation
InventorsKatsumi URYU, Tadaharu MINATO, Takahiro NAKATANI
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Abstract
A SEB resistance evaluation method includes: disposing an excitation source within a model of a semiconductor device; and determining an energy of the excitation source at which the semiconductor device exhibits thermal runaway, while varying a voltage applied to the model of the semiconductor device and the energy of the excitation source.
Claims12
A SEB resistance evaluation method for evaluating single event burnout (SEB) resistance of a semiconductor device by computer simulation, the method comprising:
- disposing an excitation source within a model of the semiconductor device;
- and
- determining an energy of the excitation source at which the semiconductor device exhibits thermal runaway, while varying an applied voltage to the model of the semiconductor device and the energy of the excitation source.
A SEB resistance evaluation device for evaluating single event burnout (SEB) resistance of a semiconductor device by computer simulation, the device comprising:
- a processor to execute a program;
- and
- a memory to store the program which, when executed by the processor, performs processes of,
- disposing an excitation source within a model of the semiconductor device;
- and
- determining an energy of the excitation source at which the semiconductor device exhibits thermal runaway, while varying an applied voltage to the model of the semiconductor device and the energy of the excitation source.
Dependencies are inferred from the claim text.