Power probe

A probe system including a probe and a test instrument for measuring signals of a device under test (DUT), the probe system comprising:

• a probe head of the probe comprising:
• a plurality of leads configured to connect to signal probe points of the DUT;
• and
• a sensor connected between two leads of the plurality of leads;
• at least one probe output configured to connect to the probe and the test instrument;
• a current detection circuit configured to detect current of the DUT through the sensor, and to provide a detected current signal;
• a voltage detection circuit configured to detect voltage of the DUT between the sensor and ground, and to provide a detected voltage signal;
• and
• a deskew circuit in at least one of a current path following the current detection circuit or a voltage path following the voltage detection circuit, the deskew circuit being configured to reduce misalignment in time between the detected current signal and the detected voltage signal.

A probe system for measuring signals of a device under test (DUT) over a period of time, the probe system comprising:

• a time domain test instrument;
• and
• a probe connected to at least one channel of the time domain test instrument via at least one probe output, the probe comprising:
• a plurality of leads configured to connect to signal probe points of the DUT;
• a current detection circuit configured to detect current of the DUT through a sensor over the period of time, and to provide a corresponding detected current signal to be output to the test instrument;
• and
• a voltage detection circuit configured to detect voltage of the DUT between the sensor and ground over the period of time, and to provide a corresponding detected voltage signal to be output to the test instrument.