Coated cutting tool

A coated cutting tool comprising a substrate comprising a cubic boron nitride sintered body and a coating layer formed on the substrate, wherein

• the coating layer comprises a Ti carbonitride layer comprising a composition represented by a following formula (i),
• Ti(CxN1-x) (i)
• in the formula, x represents an atomic ratio of the C element to a total of the C element and the N element at a position where a thickness is 50% from the substrate side in the Ti carbonitride layer, and satisfies 0.1<x<0.5;
• an average thickness of the Ti carbonitride layer is 0.5 μm or more and 5.0 μm or less;
• in the Ti carbonitride layer, an atomic ratio R75 of the C element to a total of the C element and the N element at a position where a thickness is 75% from the substrate side is higher than an atomic ratio R25 of the C element to a total of the C element and the N element at a position where a thickness is 25% from the substrate side;
• in the Ti carbonitride layer, a texture coefficient TC (111) of a (111) plane represented by a following formula (1) is 1.0 or more and 2.0 or less;
• and
• in X-ray diffraction measurement of the Ti carbonitride layer, an absolute value of a difference between a maximum value and a minimum value of 2θ represented by a following formula (2) is 0.1° or less on the (111) plane when the measurement is performed at each of ψ angles of 0°, 30°, 50° and 70°,
• TC
• 
• (
• 111
• )
• =
• I
• 
• (
• 111
• )
• I
• 0
• 
• (
• 111
• )
• 
• {
• 1
• 6
• 
• Σ
• 
• I
• 
• (
• hkl
• )
• I
• 0
• 
• (
• hkl
• )
• }
• -
• 1
• (
• 1
• )
• in the formula (1), I(hkl) represents a peak intensity of an (hkl) plane in X-ray diffraction of the Ti carbonitride layer, I0(hkl) represents a standard diffraction intensity of the (hkl) plane in an ICDD card number 00-042-1488, and (hkl) indicates six crystal planes of (111), (200), (220), (311), (420), (422);
• Absolute value of the difference between the maximum value and the minimum value of 2θ=|2θ max−2θ min|(2) in the formula (2), 2θ max represents a maximum value among peak positions 2θ of a crystal plane when the ψ angle is 0°, 30°, 50°, and 70°, and 2θ min represents a minimum value among peak positions 2θ of the crystal plane when the ψ angle is 0°, 30°, 50°, and 70°.