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AssigneeRealtek Semiconductor Corp.
InventorsYU-CHANG CHEN, SHIH-HSIUNG HUANG, JIAN-RU LIN
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The invention discloses a calibration circuit and a calibration method for an analog-to-digital converter (ADC). The calibration method of the ADC includes the following steps: (a) resetting the voltage at the first input of the comparator and the voltage at the second input of the comparator; (b) changing a terminal voltage of at least one capacitor in the first capacitor group; (c) the ADC generating a first digital code; (d) after the first digital code is obtained, resetting the voltage at the first input of the comparator and the voltage at the second input of the comparator; (e) changing a terminal voltage of at least one capacitor in the third capacitor group; and (f) the ADC generating a second digital code. The first digital code and the second digital code are used to correct the output of the ADC.
A method for calibrating an analog-to-digital converter (ADC), the ADC including a bridge digital-to-analog converter (DAC), the bridge DAC including a first capacitor array and a second capacitor array, the first capacitor array being coupled to a first input terminal of a comparator of the ADC, the second capacitor array being coupled to a second input terminal of the comparator, the first capacitor array including a first capacitor group, a second capacitor group and a first bridge capacitor, the first capacitor group being electrically connected to the comparator, the second capacitor group being coupled to the comparator through the first bridge capacitor, the second capacitor array including a third capacitor group, a fourth capacitor group and a second bridge capacitor, the third capacitor group being electrically connected to the comparator, and the fourth capacitor group being coupled to the comparator through the second bridge capacitor, the method comprising:
A calibration circuit for calibrating an analog-to-digital converter (ADC), the ADC including a bridge digital-to-analog converter (DAC), the bridge DAC including a first capacitor array and a second capacitor array, the first capacitor array being coupled to a first input terminal of a comparator of the ADC, the second capacitor array being coupled to a second input terminal of the comparator, the first capacitor array including a first capacitor group, a second capacitor group and a first bridge capacitor, the first capacitor group being electrically connected to the comparator, the second capacitor group being coupled to the comparator through the first bridge capacitor, the second capacitor array including a third capacitor group, a fourth capacitor group and a second bridge capacitor, the third capacitor group being electrically connected to the comparator, and the fourth capacitor group being coupled to the comparator through the second bridge capacitor, the calibration circuit comprising:
Dependencies are inferred from the claim text.