Substrate for electric element and manufacturing method therefor
AssigneeSamsung Electronics Co., Ltd.
InventorsKyungwoon JANG, Changjoon LEE, Daesuck HWANG
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Abstract
Various embodiments comprise: a substrate; a plurality of unit electric elements arranged on the substrate at regular intervals; and at least one conductive path electrically connected to each of the plurality of unit electric elements nearby and having an energized inspection area formed at an end thereof. It is possible to determine whether each of the plurality of unit electric elements is electrically good or defective by using an energized inspection area of the conductive path. Other various embodiments may be possible.
Claims20
A substrate comprising:
- a base substrate layer;
- a plurality of unit electric elements arranged on the base substrate layer at a predetermined interval;
- and
- one or more conductive paths electrically connected to the plurality of unit electric elements around the plurality of unit electric elements, respectively, and each of which has a current flow inspection area at an end thereof,
- wherein the electrical qualities of the plurality of unit electric elements are determined by using the current flow inspection areas of the conductive paths.
A method for manufacturing a carrier substrate, the method comprising:
- forming a plurality of light emitting layers in a base substrate layer;
- forming one or more conductive paths such that the conductive paths are electrically connected in common to the plurality of light emitting layers around the light emitting layers;
- transferring the conductive paths and the light emitting layers to the carrier substrate;
- dividing the light emitting layers transferred to the carrier substrate into a plurality of unit micro LEDs;
- and
- performing a current flow inspection for determining the qualities of the divided micro LEDs through the one or more conductive paths.
A carrier substrate comprising:
- a base substrate layer;
- a plurality of micro LEDs arranged on the base substrate layer at a predetermined interval;
- and
- one or more conductive paths electrically connected to the plurality of micro LEDs around the plurality of micro LEDs, respectively, and each of which has a current flow inspection area at an end thereof,
- wherein the electrical qualities of the plurality of micro LEDs are determined by using the current flow inspection areas of the conductive paths.
Dependencies are inferred from the claim text.