Self-limiting growth
AssigneeLam Research Corporation
InventorsJoshua Collins, Griffin John Kennedy, Hanna Bamnolker, Michal Danek, Shruti Vivek Thombare, Patrick van Cleemput, Gorun Butail
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AssigneeLam Research Corporation
InventorsJoshua Collins, Griffin John Kennedy, Hanna Bamnolker, Michal Danek, Shruti Vivek Thombare, Patrick van Cleemput, Gorun Butail
Estimating the term…
Provided herein are methods and apparatuses for forming metal films such as tungsten (W) and molybdenum (Mo) films on semiconductor substrates. The methods involve forming a reducing agent layer, then exposing the reducing agent layer to a metal precursor to convert the reducing agent layer to a layer of the metal. In some embodiments, the reducing agent layer is a silicon- (Si-) and boron- (B-) containing layer. The methods may involve forming the reducing agent layer at a first substrate temperature, raising the substrate temperature to a second substrate temperature, and then exposing the reducing agent layer to the metal precursor at the second substrate temperature. The methods may be used to form fluorine-free tungsten or molybdenum films in certain embodiments. Apparatuses to perform the methods are also provided.
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Dependencies are inferred from the claim text.