Glitch profiling in an integrated circuit

A circuit comprising:

• an input to receive a power supply voltage;
• a glitch measurement circuit, coupled to the input, the glitch measurement circuit comprising:
• a first comparator to compare a glitch in the power supply voltage received at the input to a first threshold voltage,
• a first counter to generate a first count indicative of a time duration the first comparator indicates that the glitch trips the first threshold voltage,
• a second comparator to compare the glitch in the power supply voltage received at the input to a second threshold voltage, the second threshold voltage being different than the first threshold voltage,
• a second counter to generate a second count indicative of a time duration the second comparator indicates that the glitch trips the second threshold voltage;
• and
• a glitch profile circuitry utilizing the first count and the second count to generate a multi-voltage profile of the glitch, wherein the multi-voltage profile includes indications of the time durations indicated by the first count and the second count.