Apparatus, method and computer program for identifying defective devices

A apparatus for identifying a path pattern of devices that produces a defective product in a production line where a product is produced via a plurality of devices, the apparatus comprising:

• a production path extractor configured to extract a production path indicating devices via which the product is produced and an order of passing through the devices;
• a production path quality generator configured to generate a production path quality indicating a quality of a group of products produced through the production path;
• a path pattern generator configured to generate a possible path pattern indicating devices via which the product is produced and an order of passing through the devices, in accordance with a number of indispensable devices indicating a number of devices that must be included in the path pattern;
• an association relationship generator configured to generate an association relationship between the production path and the path pattern;
• a path pattern quality estimator configured to estimate a path pattern quality indicating a quality of a group of products produced through a production path included in the path pattern, based on the association relationship and the production path quality;
• and
• a defective path pattern identifier configured to identify a defective path pattern for which a value of the path pattern quality is equal to or larger than a predetermined threshold value.