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US 2020/0400741 A1Published application
Functional testing with inline parametric testing
AssigneeTeradyne, Inc.
InventorsDavid Kaushansky, Thomas D. Jacobs
Life of this patent
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Abstract
An example test system includes a circuit to sample a signal that is repetitive in cycles to obtain data; a processor configured to generate an eye diagram based on the data, where the eye diagram represents parametric information about the signal; and a functional test circuit to receive the signal and to perform one or more functional tests on the signal. The test systems is configured to receive the signal from a unit under test and to allow the signal to pass to the functional test circuit inline without changing at least part of the signal.
Claims25
A test system comprising:
- a circuit to sample a signal that is repetitive in cycles to obtain data;
- a processor configured to generate an eye diagram based on the data, the eye diagram representing parametric information about the signal;
- and
- a functional test circuit to receive the signal and to perform one or more functional tests on the signal;
- wherein the test systems is configured to receive the signal from a unit under test and to allow the signal to pass to the functional test circuit inline without changing at least part of the signal.
2 more elements
A method comprising:
- sampling a signal that is repetitive in cycles to obtain data;
- generating an eye diagram based on the data, the eye diagram representing parametric information about the signal;
- and
- sending the signal inline to a functional test circuit to perform one or more functional tests on the signal without changing informational content of the signal.
1 more element
Dependencies are inferred from the claim text.