Environmental parameter measurement systems
AssigneeMetis IP (Suzhou) LLC
InventorsJunjun FAN, Kan LI, Shan GUAN
Life of this patent
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AssigneeMetis IP (Suzhou) LLC
InventorsJunjun FAN, Kan LI, Shan GUAN
Estimating the term…
The present disclosure discloses a method for determining a corrected measured value of an environmental parameter. The method may include obtaining a relationship between a deviation of a measured value of an environmental parameter of a first sensing device and at least one measurement condition of a heat generating device. The first sensing device may be located near the heat generating device. The method may further include obtaining at least one current value of the at least one measurement condition and a current measured value of the environmental parameter, and determining a current deviation based at least in part on the at least one current value of the at least one measurement condition of the heat generating device and the relationship. The method may further include determining a corrected measured value of the environmental parameter based on the current measured value of the environmental parameter and the current deviation.
A system, comprising:
A method implemented on a computing device having at least one processor and at least one computer-readable storage medium, the method comprising:
A non-transitory computer readable medium, comprising a set of instructions, wherein when executed by at least one processor, the set of instructions directs the at least one processor to effectuate a method, the method comprising:
Dependencies are inferred from the claim text.