Method for cleaning and coating a tip of a test probe utilized in a test system for an integrated circuit package
AssigneeAculon, Inc.
InventorsERIC L BRUNER, ERIC L. HANSON
Life of this patent
Estimating the term…
Abstract
A method for cleaning and coating a tip of a test probe in an integrated circuit package test system is provided. The method includes 1) saturating a brush tip comprising nonporous bristles with a solution of phosphonic acid; 2) applying the solution of phosphonic acid to the tip of the test probe with the brush tip to coat the tip of the test probe with the solution of phosphonic acid; and 3) allowing the solution of phosphonic acid to dry on the tip of the test probe and form a self-assembled monolayer of phosphonates thereon.
Claims12
A method of cleaning and coating a tip of a test probe in a test system for an integrated circuit package, said method comprising 1) saturating a brush tip comprising nonporous bristles with a solution of phosphonic acid;
- 2) applying the solution of phosphonic acid to the tip of the test probe with the brush tip to coat the tip of the test probe with the solution of phosphonic acid;
- and 3) allowing the solution of phosphonic acid to dry on the tip of the test probe and form a self-assembled monolayer of phosphonates thereon.
A method of cleaning and coating a tip of a test probe in a test system for an integrated circuit package, said method comprising 1) saturating a brush tip comprising metal bristles with a solution of phosphonic acid;
- 2) applying the solution of phosphonic acid to the tip of the test probe with the brush tip to coat the tip of the test probe with the solution of phosphonic acid;
- and 3) allowing the solution of phosphonic acid to dry on the tip of the test probe under ambient conditions and form a self-assembled monolayer of phosphonates thereon, wherein the self-assembled monolayer of phosphonates is less than 5 nanometers thick.
Dependencies are inferred from the claim text.