Determination of the dispersion of an electronic component
AssigneeSTMicroelectronics (Crolles 2) SAS
InventorYann CARMINATI
Life of this patent
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Abstract
A value representative of a dispersion of a propagation delay of assemblies of electronic components is determined. A component test structure includes stages of components and a logic circuit connected in a ring. Each stage includes two assemblies of similar components configured to conduct a signal. A test device is configured to obtain values of the component test structure and to perform operations on these values.
Claims22
A device for determining a value representative of the dispersion of a propagation delay of assemblies of electronic components, the device comprising:
- at least one component test structure, wherein each component test structure comprises stages of components and a logic circuit connected in a ring, wherein each stage comprises two assemblies of similar components configured to conduct a signal;
- and
- a test device configured to obtain values of the at least one test structure and to perform operations on these values.
A method of determining a value representative of the dispersion of a propagation delay of assemblies of electronic components, comprising:
- calculating a difference between a sum of the longest propagation delays of each pair among pairs of assemblies of electronic components, and a sum of the shortest propagation delays in each pair among pairs of assemblies of electronic components.
A device for determining a value representative of the dispersion of a propagation delay of assemblies of electronic components, the device comprising:
- at least one component test structure, wherein each component test structure comprises:
- stages of components and a logic circuit connected in a ring, wherein each stage comprises two assemblies of similar components, and wherein each assembly is configured to conduct a signal to an output of the assembly, and
- a multiplexer having inputs coupled to outputs of the two assemblies of the stage;
- and
- a test device configured to obtain values of the at least one test structure and to perform operations on these values;
- wherein each multiplexer is configured to:
- select during a first phase the input which is connected to the assembly of said two assemblies having a shortest propagation delay;
- and
- select during a second phase the input which is connected to the assembly of said two assemblies having a longest propagation delay.
Dependencies are inferred from the claim text.