Angle detection system
AssigneeTopcon Corporation
InventorsSatoshi YASUTOMI, Yuji TAKANO
Life of this patent
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AssigneeTopcon Corporation
InventorsSatoshi YASUTOMI, Yuji TAKANO
Estimating the term…
Provided is an angle detection system including: a target unit including a reflection target and an encoder pattern showing an angle of the target unit; and a surveying instrument including a survey unit configured to measure a distance and angle to the reflection target, an encoder pattern reading unit configured to read a bit pattern of the encoder pattern from an image of the encoder pattern, a display unit, and an arithmetic control unit. The surveying instrument includes at least one imaging unit changeable in focal length, and is configured to calculate a distance and angle to the reflection target, to set an imaging magnification of the imaging unit, to set a cutout region of the encoder pattern by using the image displayed on the display unit, to determine success of identification of the encoder pattern and, in the case of success, to calculate an encoder pattern read angle.
An angle detection system comprising:
An angle detection system comprising:
Dependencies are inferred from the claim text.