Charged Particle Beam Device
AssigneeHitachi High-Technologies Corporation
InventorsRyo HIRANO, Hideo MORISHITA, Toshihide AGEMURA, Junichi KATANE, Tsunenori NOMAGUCHI
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AssigneeHitachi High-Technologies Corporation
InventorsRyo HIRANO, Hideo MORISHITA, Toshihide AGEMURA, Junichi KATANE, Tsunenori NOMAGUCHI
Estimating the term…
A charged particle beam device includes: a charged particle source that emits a charged particle beam; a boosting electrode disposed between the charged particle source and a sample to form a path of the charged particle beam and to accelerate and decelerate the charged particle beam; a first pole piece that covers the boosting electrode; a second pole piece that covers the first pole piece; a first lens coil disposed outside the first pole piece and inside the second pole piece to form a first lens; a second lens coil disposed outside the second pole piece to form a second lens; and a control electrode formed between a distal end portion of the first pole piece and a distal end portion of the second pole piece to control an electric field formed between the sample and the distal end portion of the second pole piece.
A charged particle beam device, comprising:
The charged particle beam device according to claim wherein
Dependencies are inferred from the claim text.