Charged particle beam system
AssigneeHitachi High-Technologies Corporation
InventorsRyo KADOI, Wen LI, Naoya ISHIGAKI
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AssigneeHitachi High-Technologies Corporation
InventorsRyo KADOI, Wen LI, Naoya ISHIGAKI
Estimating the term…
A charged particle beam system includes a charged particle beam device 101 and the detection circuit 114. The charged particle beam device 101 includes a first antenna 102 having a first resonant frequency and a second antenna 103 having a second resonant frequency. The detection circuit 114 includes a first amplitude detection unit 110 which detects a first amplitude of a signal after passing a first filter 107, a second amplitude detection unit 111 which detects a second amplitude of a signal after passing a second filter 108, and an amplitude comparison unit 113 which compares the first amplitude with the second amplitude.
A charged particle beam system comprising a charged particle beam device and a detection circuit connected to the charged particle beam device, wherein
A charged particle beam system comprising a charged particle beam device and a detection circuit connected to the charged particle beam device, wherein
Dependencies are inferred from the claim text.