Reduction of metal resistance in vertical reram cells
AssigneeInternational Business Machines Corporation
InventorsTakashi Ando, Pouya Hashemi, Choonghyun Lee
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AssigneeInternational Business Machines Corporation
InventorsTakashi Ando, Pouya Hashemi, Choonghyun Lee
Estimating the term…
Embodiments of the invention include resulting structures and a method for fabricating a vertical ReRAM array structure. The embodiments of the invention include forming alternating layers over a metal layer of a structure, wherein a layer of the alternating layers comprises a low resistivity material, masking one or more portions of a topmost layer of the alternating layers, and etching one or more portions of the alternating layers down to the metal layer. Embodiments of the invention also include depositing a lateral electrode layer over the etched one or more portions of the alternating layers, performing an etch back on the lateral electrode layer, and forming a vertical electrode layer over the structures.
A method for fabricating a vertical ReRAM array structure, the method comprising:
A resistive switching device comprising:
A resistive random access memory structure comprising:
Dependencies are inferred from the claim text.