Measurement device and measurement method
AssigneeFuji Corporation
InventorToshiyuki SAWADA
Life of this patent
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Abstract
In the measurement device, electrical characteristics of a component can be measured adequately even if the component size is small. In the measurement device, at least a part of the component holding section is an antistatic section made of an antistatic material. Since the surface resistance of the antistatic section is large, it is possible to measure the electrical characteristics of a component in a state where the component is held by the antistatic section. Therefore, even if the size of the component is small, scattering of the component is prevented and the electrical characteristics can be adequately measured.
Claims9
1-8. (canceled)
A measurement device that is provided on a mounting machine configured to pick up a component supplied from a component supply device and mount the component on a circuit board, the measurement device comprising:
- a component holding section configured to hold the component;
- and
- a pair of measurement parts configured to approach each other and separate from each other, clamp the component held by the component holding section, and measure electrical characteristics of the component,
- wherein the component holding section includes a neutralizing section made of a conductive material and an antistatic section made of a material having antistatic properties.
Dependencies are inferred from the claim text.