Semiconductor integrated circuit and test method

A test method of testing a semiconductor integrated circuit which includes a first circuit to generate a first voltage corresponding to a temperature, an analog-to-digital converter to convert the first voltage into a first digital value, an external input terminal to which a second digital value is input from outside, a selector to select either the first digital value or the second digital value, and a second circuit to generate a second voltage based on a third digital value being a digital value selected by the selector, the test method comprising:

• performing a first process of setting the selector to select the second digital value;
• performing a second process of inputting the second digital value and verifying operation of the semiconductor integrated circuit;
• and
• performing a third process of varying the second digital value after the second process and verifying again operation of the semiconductor integrated circuit.