Built-in self-test (bist) engine configured to store a per pattern based fail status in a pattern mask register

A method, comprising:

• masking, in a pattern mask register of a built-in-self-test (BIST) engine, each test pattern of a plurality of test patterns for which a pass status value from executing the test pattern a first time is stored in the pattern mask register;
• and
• for each test pattern of the plurality of test patterns:
• determining whether or not the test pattern is masked in the pattern mask register of the BIST engine;
• in response to determining that the test pattern is not masked in the pattern mask register of the BIST engine, executing the test pattern a second time;
• and
• in response to determining that the test pattern is masked in the pattern mask register of the BIST engine, skipping the executing the test pattern the second time.