Memory device for compensating for current of off cells and operating method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorsVENKATARAMANA GANGASANI, MOO-SUNG KIM, TAE-HUI NA, JUN-HO SHIN
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AssigneeSamsung Electronics Co., Ltd.
InventorsVENKATARAMANA GANGASANI, MOO-SUNG KIM, TAE-HUI NA, JUN-HO SHIN
Estimating the term…
A memory device includes a memory cell array including a plurality of memory cells arranged at points where a plurality of word lines and a plurality of bit lines intersect; a sense amplifier configured to amplify, in a read operation mode of the memory device, a voltage difference value between a voltage of a selected word line connected to a selected memory cell of the plurality of memory cells and a reference voltage; and a leakage current compensation circuit connected to a selected word line path between the selected memory cell and the sense amplifier and configured to compensate for a total leakage current generated by unselected memory cells connected to the selected word line in the read operation mode.
A memory device comprising:
3-4. (canceled)
The memory device of claim 4, wherein the leakage current compensation circuit is electrically isolated from the selected word line path in a charge share period in which charges of a first end of the selected word line and the sense amplifier are shared.
(canceled)
(canceled)
A memory device comprising:
A memory device comprising:
25-28. (canceled)
Dependencies are inferred from the claim text.