Memory device in which locations of registers storing fail addresses are merged
AssigneeSamsung Electronics Co., Ltd.
InventorsHyung-Jin Kim, Huikap Yang
Life of this patent
Estimating the term…
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AssigneeSamsung Electronics Co., Ltd.
InventorsHyung-Jin Kim, Huikap Yang
Estimating the term…
A memory device includes a bank that includes first memory cells connected to a first column selection line and second memory cells connected to a second column selection line, a first column decoder that selects the first memory cells by transmitting a first column selection signal in a first direction through the first column selection line, and a second column decoder that selects the second memory cells by transmitting a second column selection signal in a second direction opposite to the first direction through the second column selection line. The first column decoder includes a first register that stores a first fail column address of the first memory cells, and a second register that stores a second fail column address of the second memory cells.
A memory device comprising:
A memory device comprising:
A memory device comprising:
Dependencies are inferred from the claim text.