Measurement system and measurement method
AssigneeOMRON Corporation
InventorsTomonori ARIYOSHI, Toyoo IIDA
Life of this patent
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AssigneeOMRON Corporation
InventorsTomonori ARIYOSHI, Toyoo IIDA
Estimating the term…
A configuration capable of realizing object authentication with higher accuracy is desired. A measurement system includes a shape measurement unit that performs measurement, a storage unit that stores an entire model for each work piece type, and a recognition processing unit that executes object authentication based on whether or not a three-dimensional shape measured by the shape measurement unit is consistent with any one entire model stored in the storage unit. The entire model for each work piece type is specified by a combination of a plurality of partial models and each of the plurality of partial models is correspondently given a degree of importance. The recognition processing unit determines whether or not the three-dimensional shape is consistent with any one entire model based on degrees of importance corresponding to one or more partial models included in the entire model.
A measurement system, comprising:
A measurement method comprising:
Dependencies are inferred from the claim text.