Tester and method for testing a device under test using relevance scores
AssigneeAdvantest Corporation
InventorJochen RIVOIR
Life of this patent
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AssigneeAdvantest Corporation
InventorJochen RIVOIR
Estimating the term…
A tester for testing a device under test is shown, having a test unit configured for performing a test of the device under test using multiple test cases, each test case having variable values of a set of predetermined variables, the test units configured to derive an output value for each test case indicating whether the device under test validly operates at a current test case or whether the device under test provides an error at the current test case; and an evaluation unit configured for evaluating the multiple test cases based on a plurality of subsets of the predetermined input variables with respect to the output value, the evaluation unit configured for providing a number of plots of the evaluation of the multiple test cases where each plot indicates the impact of one subset of the plurality of subsets of the predetermined input variables to the output value in dependence on respective relevance scores or associated with the respective relevance scores.
A tester for testing a device under test, the tester comprising:
A method for testing a device under test, the method comprising:
A non-transitory digital storage medium having stored thereon a computer program for performing a method of testing a device under test, the method comprising:
Dependencies are inferred from the claim text.