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US 2019/0377296 A1Published application
Identifying linear defects
AssigneeHP Indigo B.V.
InventorsOren Haik, Oded Perry, Avi Malki
Life of this patent
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Abstract
In an example, a method includes determining, by a processor, a cumulative indication of defects present in linear sub-portions located in a common position of each of a plurality of substrate sheets bearing a printed image. The method may further comprise identifying, by the processor, a linear defect based on the cumulative indication of defects.
Claims15
A method comprising:
- determining, by a processor, a cumulative indication of defects present in linear sub-portions located in a common position of each of a plurality of substrate sheets bearing a printed image;
- and
- identifying, by the processor, a linear defect based on the cumulative indication of defects.
An apparatus comprising:
- scanning apparatus to scan a printed image;
- and
- processing circuitry comprising:
- an image analyser to identify defects in a printed image;
- and
- a defect categorising module to accumulate an indication of any defects in each of a plurality of corresponding linear sub-portions of a plurality of printed images.
3 more elements
A tangible machine readable medium comprising instructions which, when executed by a processor, cause the processor to:
- determine an accumulated one dimensional projection of data indicative of defects detected across each of a plurality of printed substrate sheets;
- compare the accumulated one dimensional projection to a threshold;
- and
- where the accumulated one dimensional projection exceeds a threshold, generate an indication of a presence of a linear defect.
1 more element
Dependencies are inferred from the claim text.