Distance measurement using high density projection patterns

A non-transitory machine-readable storage medium encoded with instructions executable by a processor of a distance sensor, wherein, when executed, the instructions cause the processor to perform operations, the operations comprising:

• instructing a pattern projector of the distance sensor to project a pattern of light onto an object, wherein the pattern comprises a plurality projection artifacts, wherein each projection artifact of the plurality of projection artifacts is associated with a trajectory representing a range of potential movement of the each projection artifact on an imaging sensor of the distance sensor, where at least a first threshold distance exists between two trajectories that are adjacent in a direction parallel to a direction of movement of the trajectories, and wherein at least a second threshold distance exists between two trajectories that are adjacent in a direction perpendicular to the direction of movement of the trajectories;
• detecting a location of a first projection artifact of the plurality of artifacts in an image of the object that includes the pattern of light, wherein the detecting comprises identifying an area of peak light intensity within a window corresponding to a trajectory of the first projection artifact;
• and
• calculating a distance from the distance sensor to the object based in part on the location of the first projection artifact

A method, comprising:

• instructing, by a processing system of a distance sensor, a pattern projector of the distance sensor to project a pattern of light onto an object, wherein the pattern comprises a plurality projection artifacts;
• detecting, by the processing system, a location of a first projection artifact of the plurality of artifacts in an image of the object that includes the pattern of light, wherein the detecting comprises identifying an area of peak light intensity within a window corresponding to a trajectory of the first projection artifact, wherein the trajectory represents a range of potential movement of the first projection artifact on an imaging sensor of the distance sensor;
• and
• calculating, by the processing system, a distance from the distance sensor to the object based in part on the location of the first projection artifact.