Calibration arrangement and method for deriving a resistance of a resistor

A tester for testing a device under test, the tester comprising:

• a controlled power source, and
• a calibration circuit for calibrating a power source, the calibration circuit comprising:
• a first resistor with a first resistance operable to be used in a calibration of the power source;
• and
• a second resistor with a second resistance operable to be used in the calibration of the power source, wherein the second resistance is smaller than the first resistance;
• wherein the calibration circuit is configured to allow for a measurement of the first resistance of the first resistor;
• and
• wherein the calibration circuit is configured to form a series connection comprising the first resistor and of the second resistor;
• and
• wherein the calibration circuit is configured to provide at least two voltage measurements between at least two different pairs of circuit nodes of the series connection, wherein a same current is applied during the at least two voltage measurements, wherein the calibration circuit is further configured to derive the second resistance of the second resistor based on the at least two voltage measurements and a result of the measurement of the first resistance of the first resistor.

A method for deriving a resistance of a resistor in a calibration arrangement, the method comprising:

• measuring a first resistance of a first resistor;
• forming a series connection of the first resistor and a second resistor, wherein the second resistor comprises a second resistance;
• measuring at least two voltages between at least two different pairs of circuit nodes of the series connection, when a same current is applied during the at least two voltage measurements;
• and
• deriving the second resistance of the second resistor on the basis of the at least two measured voltages and a result of the measurement of the first resistance of the first resistor.

A non-transitory digital storage medium having a computer program stored thereon that when executed performs a method of deriving a resistance of a resistor in a calibration arrangement, said method comprising:

• measuring a first resistance of a first resistor;
• forming a series connection of the first resistor and a second resistor, wherein the second resistor comprises a second resistance;
• measuring at least two voltages between at least two different pairs of circuit nodes of the series connection, when a same current is applied during the at least two voltage measurements;
• and
• deriving the second resistance of the second resistor on the basis of the at least two measured voltages and a result of the measurement of the first resistance of the first resistor.