Probe card device and three-dimensional signal transfer structure thereof
AssigneeChunghwa Precision Test Tech. Co., Ltd.
InventorsWEN-TSUNG LEE, KAI-CHIEH HSIEH, WEI-JHIH SU
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AssigneeChunghwa Precision Test Tech. Co., Ltd.
InventorsWEN-TSUNG LEE, KAI-CHIEH HSIEH, WEI-JHIH SU
Estimating the term…
A three-dimensional (3D) signal transfer structure of a probe card device includes a transfer plate, a supporting frame, and a guiding plate. The transfer plate has a first surface and a second surface that is opposite to the first surface. The transfer plate includes a plurality of signal circuits each having a signal contact arranged on the first surface. The supporting frame is abutted against and fixed onto the first surface of the transfer plate. A portion of the first surface abutted against the supporting frame is arranged outside the signal contacts. The guiding plate has a plurality of thru-holes and is disposed on the supporting frame. The guiding plate, the supporting frame, and the transfer plate jointly and surroundingly define a receiving space, and the signal contacts of the transfer plate are arranged in the receiving space.
A probe card device, comprising:
A three-dimensional (3D) signal transfer structure of a probe card device, comprising:
Dependencies are inferred from the claim text.