Probe card device and flat signal transfer structure thereof
AssigneeChunghwa Precision Test Tech. Co., Ltd.
InventorsWEN-TSUNG LEE, KAI-CHIEH HSIEH, WEI-JHIH SU
Life of this patent
Estimating the term…
Loading patent…
AssigneeChunghwa Precision Test Tech. Co., Ltd.
InventorsWEN-TSUNG LEE, KAI-CHIEH HSIEH, WEI-JHIH SU
Estimating the term…
A flat signal transfer structure of a probe card device includes a transfer plate and a retaining cover. The transfer plate has a first surface and a second surface that is opposite to the first surface. The transfer plate includes a receiving slot recessed from the first surface and a plurality of signal circuits each having a signal contact arranged at a bottom of the receiving slot. A portion of the transfer plate arranged around and adjacent to the receiving slot is defined as a supporting portion. The retaining cover has a plurality of thru-holes and is disposed on the supporting portion. The retaining cover and the receiving slot of the transfer plate jointly and surroundingly define a receiving space, and the signal contacts of the transfer plate are arranged in the receiving space.
A probe card device, comprising:
A flat signal transfer structure of a probe card device, comprising:
Dependencies are inferred from the claim text.