Probe card including straight needle having adjustable contact force
AssigneeTeps Co., Ltd.
InventorsJaebok LEE, Deokha HWANG
Life of this patent
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AssigneeTeps Co., Ltd.
InventorsJaebok LEE, Deokha HWANG
Estimating the term…
Disclosed is a needle probe card including: a first plate having a plurality of needle holes into which straight needles are inserted and installed to face a test object; a second plate having a plurality of needle holes into which the straight needles are inserted and installed above the first plate so as to be relatively movable in a first direction with respect to the first plate; a needle drop prevention plate having a plurality of needle holes into which the straight needles are inserted and installed between the first plate and the second plate so as to be relatively movable in the first direction with respect to each of the first plate and the second plate; and a displacement amount adjustment means configured to adjust a relative displacement amount among the first plate, the second plate, and the needle drop prevention plate in the first direction.
A straight needle probe card capable of adjusting a contact force of straight needles, the straight needle probe card comprising:
A method for adjusting a contact force of straight needles of a straight needle probe card, the method comprising:
Dependencies are inferred from the claim text.