Systems and methods for monitoring junction temperature of a semiconductor switch
AssigneeGeneral Electric Company
InventorsRuxi Wang, Peter Almern Losee, Juan Antonio Sabate, Krishna Mainali, Tomas Sadilek
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AssigneeGeneral Electric Company
InventorsRuxi Wang, Peter Almern Losee, Juan Antonio Sabate, Krishna Mainali, Tomas Sadilek
Estimating the term…
A system for monitoring a junction temperature of a semiconductor device includes a sensing resistor electrically coupled to a source terminal of the semiconductor device in a gate loop of the semiconductor device. The system includes a detection circuit electrically coupled to the gate loop of the semiconductor device and configured to measure a voltage difference across the sensing resistor. The system also includes an electronic control unit electrically coupled to the gate loop and the detection circuit. The electronic control unit is configured to determine a first gate current peak during a switching process of the semiconductor device, wherein the first gate current peak is determined based on the voltage detected by the detection circuit. The electronic control unit is configured to determine the junction temperature based on the first gate current peak.
A system for monitoring a junction temperature of a semiconductor device, comprising:
A semiconductor switch device, comprising:
A method of online monitoring a junction temperature of a semiconductor switch, comprising:
Dependencies are inferred from the claim text.