Methodology for in situ characterizing and calibrating an entangled photon distribution system
AssigneeU.S. Army Research Laboratory ATTN: RDRL-LOC-I
InventorsDaniel E. Jones, Brian T. Kirby, Michael Brodsky
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AssigneeU.S. Army Research Laboratory ATTN: RDRL-LOC-I
InventorsDaniel E. Jones, Brian T. Kirby, Michael Brodsky
Estimating the term…
A novel methodology for characterizing and calibrating an entangled photon distribution system is disclosed. The entangled photon distribution system includes at least a source of entangled photon pairs, two photon detectors which detect photons among two channels and a controller. The methodology includes: for at least two different operational setting levels of the source of entangled photon pairs, measuring count rates for photons detected by the two photon detectors, individually and coincidently; fitting the measured individual and coincidence count rate data for the at least two different operational setting levels with theoretical models of detection probability; and determining operational parameters of the system from the fitting. The determined operational parameters of the system include the rate of generated entangled photon pairs by the source, the rates of Raman-scattered photons generated in the first and second channels, respectively, and the efficiency of the two photon detectors, respectively.
A method for characterizing and calibrating an entangled photon distribution system having a source of entangled photon pairs, and two photon detectors which detect photons among two channels, the method comprising:
An entangled photon distribution system comprising:
A controller for use with an entangled photon distribution system having a source of entangled photon pairs, and two photon detectors which detect photons among two channels, the controller configured to execute machine-executable instructions enabling the controller to implement a method comprising:
Dependencies are inferred from the claim text.