Device for inspecting mask plate, method for inspecting mask plate, and corresponding method for controlling light sources
AssigneesOrdos Yuansheng Optoelectronics Co., Ltd., Boe Technology Group Co., Ltd.
InventorsZhiming Lin, Chunchieh Huang, Bili Baiyin, Zhiyuan Hao, De Zhang, Xiaolin Xin, Xu Liu, Dongwei Li
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